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The influence of gate dielectrics on a high-mobility n-type conjugated polymer in organic thin-film transistors

机译:栅极电介质对有机薄膜晶体管中高迁移率n型共轭聚合物的影响

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摘要

Organic thin-film transistors based on a high mobility n-type semiconductor poly{[n,n9-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,59-(2,29-bithiophene)} P(NDI2OD-T2) and different polymer gate dielectrics are fabricated. The average electron mobility decreases from 0.76 to 0.08 cm²/Vs with the increase of the gate dielectric constant from 2.6 to 7.8. The P(NDI2OD-T2) film shows unconventional face-on molecular packing, which results in short distances and pronounced interactions between electrons and gate dielectric. Therefore, the decrease of the electron mobility with the increasing dielectric constant is attributed to the Fröhlich polaron effect for the interaction between electrons in the channel and ionic polarization cloud in the gate dielectric.
机译:基于高迁移率n型半导体聚{[n,n9-双(2-辛基十二烷基)-萘-1,4,5,8-双(二​​甲酰亚胺)-2,6-二基]-的有机薄膜晶体管制备了Alt-5,59-(2,29-联噻吩)} P(NDI2OD-T2)和不同的聚合物栅极电介质。随着栅极介电常数从2.6增加到7.8,平均电子迁移率从0.76降低到0.08cm²/ Vs。 P(NDI2OD-T2)膜显示出非常规的面对面分子堆积,从而导致距离短且电子与栅极电介质之间的相互作用明显。因此,随着介电常数的增加,电子迁移率的下降归因于通道中电子与栅极电介质中离子极化云之间相互作用的Fröhlich极化子效应。

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